MIC280
Micrel
MIC280
4
May 2006
Symbol
Parameter
Condition
Min
Typ
Max     Units
Serial Data I/O Pin, DATA
V
OL
 
Low Output Voltage, Note 4 
I
OL
 = 3mA
 
 
0.3 
V
 
 
I
OL
 = 6mA
 
 
0.5 
V
V
IL
 
Low Input Voltage
3V d V
DD
 d 3.6V
 
 
0.8 
V
V
IH
 
High Input Voltage
3V d V
DD
 d 3.6V
2.1 
 
5.5 
V
C
IN
 
Input Capacitance
Note 5 
 
10
 
pF
I
LEAK
 
Input Current
 
 
 
? 
Serial Clock Input, CLK 
V
IL
 
Low Input Voltage
3V d V
DD
 d 3.6V
 
 
0.8 
V
V
IH
 
High Input Voltage
3V d V
DD
 d 3.6V
2.1
 
5.5 
V
C
IN
 
Input Capacitance
Note 5 
 
10
 
pF
I
LEAK
 
Input Current
 
 
 
? 
Interrupt Output, /INT
V
OL
 
Low Output Voltage, Note 4 
I
OL
 = 3mA
 
 
0.3
V
 
 
I
OL
 = 6mA
 
 
0.5 
V
t
INT
 
Interrupt Propagation Delay
from TEMPx < TLOWx or
 
 
[t
CONV
]     ms 
 
Notes 5, 6 
TEMPx > THIGHx or TEMPx >
 
 
 
 
 
CRITx to /INT < V
OL
; R
PULLUP
 = 10k&
 
 
t
nINT
 
Interrupt Reset Propagation Delay
from read of STATUS or A.R.A. to
 
 
1 
 
Note 5, 9 
/INT > V
OH
; R
PULLUP
 = 10k&
I
LEAK
 
 
 
 
? 
Serial Interface Timing 
t
1
 
CLK (Clock) Period
 
2.5 
 
 
t
2
 
Data In Setup Time to CLK High
 
100 
 
 
ns
t
3
 
Data Out Stable after CLK Low
 
300 
 
 
ns
t
4
 
Data Low Setup Time to CLK Low
Start Condition
100 
 
 
ns
t
5
 
Data High Hold Time after CLK
Stop Condition
100 
 
 
ns
 
High
t
TO
 
Bus Timeout
 
25 
30
35 
ms
Note 1.   Exceeding the absolute maximum rating may damage the device.
Note 2.   The device is not guaranteed to function outside its operating range. Final test on outgoing product is performed at T
A
 = 25癈.
Note 3.   Devices are ESD sensitive. Handling precautions recommended. 
Note 4.   Current into the /INT or DATA pins will result in self heating of the device. Sink current should be minimized for best accuracy.
Note 5.   Guaranteed by design over the operating temperature range.  Not 100% production tested.
Note 6.   t
INT
 and t
CRIT
 are equal to t
CONV
.
Note 7.   T
D
 is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 8.
Note 8.   t
CONV
 = t
CONV
(local) + t
CONV
(remote). Following the acquisition of either remote or local temperature data, the limit comparisons for that zone
are performed and the device status updated; Status bits will be set and /INT driven active, if applicable.
Note 9.   The interrupt reset  propogation delay is dominated by the capacitance on the bus.
Note 10.  Accuracy specication does not include quantization noise, which may be up to ?/SPAN>
1
/
2
 LSB.
Note 11.  Tested at 10-bit resolution.
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